$117,000 - $165,000 USD yearly
Originally posted 7 May 2026 by the employer.
About the role
The Senior Test Development Engineer designs and implements automated production test setups and programs for fiberoptics laser alignment and test systems in a manufacturing environment. The position is based with the Semtech Photonics Products group in Alhambra, CA.
What you'll do
- Own production test station design, implementation, and continuous improvement of manufacturing test efficiency. - Develop and deploy automated test stations integrated with Active Alignment and Pick-and-Place machines. - Collaborate with Device Design Engineering teams to define performance requirements and establish production tests and specifications. - Coordinate with engineering and quality teams to validate new testing approaches and methods for production. - Work closely with software development engineers to augment production test systems to support new test updates and product specifications. - Troubleshoot manufacturing test failures, perform root cause analysis, and implement corrective actions on production test stations.
What you'll need
- Bachelor’s degree in engineering, electronics, manufacturing, or a related technical field. - 10+ years of semiconductor lasers automated test station development experience. - Extensive experience in Active Alignment Systems and Pick-and-Place machine development and system integration. - Advanced knowledge of wafer probe test methodologies, ATE systems, parametric testing, and yield analysis. - Experience in semiconductor lasers and photodiodes manufacturing environments. - Proficiency in at least one programming language among VBA, C/C++, or Python. - Proficiency with fiberoptics test instruments including semiconductor laser controllers, optical power meters, and optical spectrum analyzers.
Nice to have
- Programming with APIs for test instruments. - Programming and scripting in Windows OS. - MATLAB experience. - Experience in semiconductor wafer fabrication and product test environments.
Skills: automated test stations, wafer probe test, ATE systems, parametric testing, semiconductor lasers